Author
Listed:
- Cheoljoon Jeong
- Eunshin Byon
- Fei He
- Xiaolei Fang
Abstract Multistage manufacturing processes with identical stages provide three-dimensional process data in which the first dimension represents the process (control/sensing) variable, the second is the stage, and the third is the measurement/sampling/data acquisition time point. Diagnosing quality faults in such processes often requires the simultaneous identification of crucial process variables and stages associated with product quality anomalies. Most existing diagnosis methods convert 3D data into a 2D matrix, resulting in loss of information and reduced diagnostic accuracy and stability. To address this challenge, we propose a penalized tensor regression model that regresses the product quality index against its 3D process data. For the estimation of high-dimensional regression coefficients with the limited amount of historical data, we apply the CANDECOMP/PARAFAC and Tucker decompositions to the coefficient tensor, which significantly reduces the number of parameters to be estimated. Based on the decompositions, a new regularization term is designed to enable the joint identification of critical process variables and stages. To estimate the parameters, we develop the block coordinate proximal descent algorithm and provide its convergence guarantee. Numerical studies demonstrate that the proposed methods can enhance diagnostic stability and on average improve the diagnostic accuracy by around 20% over existing benchmarks.
Suggested Citation
Cheoljoon Jeong & Eunshin Byon & Fei He & Xiaolei Fang, 2025.
"Tensor-based statistical learning methods for diagnosing product quality defects in multistage manufacturing processes,"
IISE Transactions, Taylor & Francis Journals, vol. 57(6), pages 706-723, June.
Handle:
RePEc:taf:uiiexx:v:57:y:2025:i:6:p:706-723
DOI: 10.1080/24725854.2024.2385670
Download full text from publisher
As the access to this document is restricted, you may want to search for a different version of it.
Corrections
All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:taf:uiiexx:v:57:y:2025:i:6:p:706-723. See general information about how to correct material in RePEc.
If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.
We have no bibliographic references for this item. You can help adding them by using this form .
If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Chris Longhurst (email available below). General contact details of provider: http://www.tandfonline.com/uiie .
Please note that corrections may take a couple of weeks to filter through
the various RePEc services.